NSUF 19-1744: Correlation of In-situ TEM Characterization and Ex-situ Microchemistry Analysis of Radiation Damage in Metal/Oxide Multilayers
Cross-sectional TEM specimens of Fe/Fe2O3 and (Fe-18%Ni)/Fe2O3 multilayers will be prepared using a Focused Ion Beam (FIB) instrument at the Analytical Instrument Facility...
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