NSUF 16-657: In Situ Observation of Lunar Crater Features in Xe Irradiated UO2 at High Dose
To simulate fission fragments damage and fission gas evolution in UO2, 300 keV Xe ion beam in Intermediate Voltage Electron Microscope (IVEM)-Tandem facility at Argonne National Laboratory (ANL) will be used to irradiate polycrystalline UO2 lamellas. The damage depth is around 150 nm, which is close to the thickness of UO2 lamellas and good for in situ transmission electron microscope (TEM) observation. The rapid turnaround experiment is to reveal the microstructure evolution of UO2 up to 5×1016 ions/cm2 as a function of irradiation dose and temperature. The TEM lamellas of UO2 are prepared using a focused ion beam (FIB) system. Dislocation loops and dislocation segments or dislocation networks will be examined by both bright field and dark field image techniques. Cavities or bubble evolution in the grain and at grain boundaries (GBs) will be investigated by the under-focus and over-focus image techniques. Revealing the nucleation and evolution of lunar crater features at high dose will be the main purpose of this study. The comparison between the microstructure features of UO2 under various doses and temperatures will shed light on both the dose and temperature effects on dislocation, bubble, and lunar crater features formation and evolution. Further, the experimental microstructure characterization is to provide a fundamental foundation for the atomic-level modeling, which are conducted at Idaho National Laboratory and Purdue University. This rapid turnaround project includes in situ TEM observation using IVEM-Tandem facility at ANL, experimental data analysis and final report, which will take about 4 months in total. The proposed research will be performed in about 3 days at ANL.
Additional Info
| Field | Value |
|---|---|
| Abstract | To simulate fission fragments damage and fission gas evolution in UO2, 300 keV Xe ion beam in Intermediate Voltage Electron Microscope (IVEM)-Tandem facility at Argonne National Laboratory (ANL) will be used to irradiate polycrystalline UO2 lamellas. The damage depth is around 150 nm, which is close to the thickness of UO2 lamellas and good for in situ transmission electron microscope (TEM) observation. The rapid turnaround experiment is to reveal the microstructure evolution of UO2 up to 5×1016 ions/cm2 as a function of irradiation dose and temperature. The TEM lamellas of UO2 are prepared using a focused ion beam (FIB) system. Dislocation loops and dislocation segments or dislocation networks will be examined by both bright field and dark field image techniques. Cavities or bubble evolution in the grain and at grain boundaries (GBs) will be investigated by the under-focus and over-focus image techniques. Revealing the nucleation and evolution of lunar crater features at high dose will be the main purpose of this study. The comparison between the microstructure features of UO2 under various doses and temperatures will shed light on both the dose and temperature effects on dislocation, bubble, and lunar crater features formation and evolution. Further, the experimental microstructure characterization is to provide a fundamental foundation for the atomic-level modeling, which are conducted at Idaho National Laboratory and Purdue University. This rapid turnaround project includes in situ TEM observation using IVEM-Tandem facility at ANL, experimental data analysis and final report, which will take about 4 months in total. The proposed research will be performed in about 3 days at ANL. |
| Award Announced Date | 2016-04-11T00:00:00 |
| Awarded Institution | Center for Advanced Energy Studies |
| Facility | Microscopy and Characterization Suite |
| Facility Tech Lead | Alina Zackrone, Wei-Ying Chen, Yaqiao Wu |
| Irradiation Facility | None |
| PI | Lingfeng He |
| PI Email | [email protected] |
| Project Type | RTE |
| RTE Number | 657 |