NSUF 17-1047: Examining microstructural differences in irradiated HT9, correlated with differences in processing prior to irradiation

The goal of this project is to do an examination of the irradiated microstructure of irradiated HT9, specifically analyzing for changes to the dislocation structure, precipitate distributions, and radiation-induced segregation. This is envisioned to be a first step in a deeper analysis of the variability of the radiation response of HT9 given different processing conditions.

TEM samples of each of the three heats of HT9, irradiated at 430°C to 8 dpa in the Advanced Test Reactor, plus unirradiated archive samples, will be prepared by electropolishing. Unirradiated samples will be prepared first to optimize the polishing conditions before moving to irradiated samples. Dislocation and large precipitate size distributions will be analyzed at the JEOL JEM 2010 TEM at the INL EML. Samples will be examined for voids but none are anticipated. Radiation-induced segregation and small (~<10 nm) precipitate size distributions will be measured using the FEI Titan Themis 200 scanning transmission electron microscope at the INL IMCL.

Six total samples will be examined, three irradiated and three unirradiated archive. Assuming 2.5 days per sample, this is 15 days of sample preparation plus TEM time.

Additional Info

Field Value
Abstract The goal of this project is to do an examination of the irradiated microstructure of irradiated HT9, specifically analyzing for changes to the dislocation structure, precipitate distributions, and radiation-induced segregation. This is envisioned to be a first step in a deeper analysis of the variability of the radiation response of HT9 given different processing conditions. TEM samples of each of the three heats of HT9, irradiated at 430°C to 8 dpa in the Advanced Test Reactor, plus unirradiated archive samples, will be prepared by electropolishing. Unirradiated samples will be prepared first to optimize the polishing conditions before moving to irradiated samples. Dislocation and large precipitate size distributions will be analyzed at the JEOL JEM 2010 TEM at the INL EML. Samples will be examined for voids but none are anticipated. Radiation-induced segregation and small (~<10 nm) precipitate size distributions will be measured using the FEI Titan Themis 200 scanning transmission electron microscope at the INL IMCL. Six total samples will be examined, three irradiated and three unirradiated archive. Assuming 2.5 days per sample, this is 15 days of sample preparation plus TEM time.
Award Announced Date 2017-09-20T12:36:56.787
Awarded Institution Center for Advanced Energy Studies
Facility Microscopy and Characterization Suite
Facility Tech Lead Alina Zackrone, Yaqiao Wu
Irradiation Facility None
PI Todd Allen
PI Email [email protected]
Project Type RTE
RTE Number 1047