NSUF 20-2997: Post-irradiation Microstructure Characterization of Radiation-Tolerant Piezoelectric Materials
A major strength of scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (STEM-EELS) approaches is that they provide high-resolution, simultaneous information about local structure, chemistry, and defects. Modern aberration-corrected microscopes, equipped with bright, sub-Angstrom electron probes and high-speed EELS spectrometers, now permit true atomic-scale spectroscopy with exceptional energy resolution. In this study, we propose a combination of STEM, EELS to fingerprint the local chemical environment, and PFM to fingerprint the local piezo response, of the irradiated BiT materials.
Additional Info
| Field | Value |
|---|---|
| Awarded Institution | Oak Ridge National Laboratory |
| Embargo End Date | 2024-05-09 |
| Facility Tech Lead | Stuart Maloy |
| NSUF Call | FY 2020 RTE 1st Call |
| PI | Eva Zarkadoula |
| PIE Facilities | Materials Science and Technology Laboratory |
| Prep Facilities | Materials Science and Technology Laboratory |
| Project Member | Dr. Edgar Buck, Staff Scientist V - Pacific Northwest National Laboratory (https://orcid.org/0000-0001-5101-9084) |
| Project Member | Dr. Pradeep Ramuhalli - Oak Ridge National Laboratory (https://orcid.org/0000-0001-6372-1743) |
| Project Member | Dr. Joshua Daw - Idaho National Laboratory (https://orcid.org/0000-0003-4377-6231) |
| Project Member | Shawn Riechers, Post-doctoral Research Associate - Pacific Northwest National Laboratory (https://orcid.org/0000-0002-5713-5534) |
| Project Member | Dr. Sacit Cetiner, Lead for Data Analytics and I&C Team - Oak Ridge National Laboratory |
| Project Member | Dr. Eva Zarkadoula, R&D staff - Oak Ridge National Laboratory (https://orcid.org/0000-0002-6886-9664) |
| Project Notes | Awarded on 02/05/2020 |
| Project Type | RTE |
| RTE Number | 2997 |
| Sample Identifiers | 9277 |