NSUF 25-5326: Linking Subgrain Lattice Strain to Irradiation Defect Evolution in Additively Manufactured 316H Stainless Steel
Fusion-based additive manufacturing (AM), commonly referred to as 3D printing, has attracted significant interest in the nuclear industry due to its capability to fabricate critical components in near-net shape. This technique typically employs a highly concentrated energy source to rapidly melt and deposit metallic materials layer by layer. The resulting unique thermal history causes hierarchical and complex microstructures in the as-built components. A key feature is the pronounced heterogeneity at the sub-grain scale, characterized by dislocation cell structures and complex lattice strain distributions, which critically influence the material’s resistance to irradiation.
However, accurately quantifying these microstructure heterogeneities remains a significant challenge, hindering efforts to establish reliable structure-property correlations. To address this gap, we have utilized state-of-the-art synchrotron X-ray nanobeam diffraction at the Advanced Photon Source of Argonne National Laboratory (ANL) to map intra-granular strain with exceptional spatial resolution and precision. We now propose a complementary in-situ irradiation experiment at the NSUF Intermediate Voltage Electron Microscope (IVEM) facility to investigate how localized irradiation defect evolution correlates with the pre-characterized lattice strain fields.
The proposed experiment will span 48 hours across two facility visits. Its successful completion is expected to provide critical insights into the irradiation behavior of AM materials, thereby supporting the application of additive manufacturing in developing advanced nuclear reactors.
Additional Info
| Field | Value |
|---|---|
| Awarded Institution | University of Alabama |
| DOI | 10.46936/NSUF/60015365 |
| Embargo End Date | 2027-09-03 |
| Facility Tech Lead | Wei-Ying Chen |
| Irradiation Facilities | Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility |
| NSUF Call | FY 2025 RTE 2nd Call |
| PI | Lin Gao |
| PIE Facilities | Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility |
| Project Member | Dr. Lin Gao, Assistant Professor - University of Alabama (https://orcid.org/0000-0001-8988-7354) |
| Project Type | RTE |