NSUF 25-5541: In-situ Irradiation and Creep Studies on Oxide Dispersion Strengthened (ODS) Alloys Synthesized using a Novel Way

This research aims to evaluate the irradiation and creep performance of novel oxide dispersion strengthened (ODS) variants of Hastelloy X, Inconel 718, and NiCoCr alloys under in-situ dual beam irradiation and irradiation creep conditions. These alloys, synthesized with and without ODS particles using a model-driven alloy design and additive manufacturing approach developed at NASA Glenn Research Center, exhibit a uniform distribution of oxide particles. We hypothesize that the incorporation of ODS particles will significantly enhance the alloys’ resistance to irradiation damage and creep deformation, particularly at elevated temperatures and doses relevant to molten salt reactor (MSR) environments. To test this hypothesis, in-situ transmission electron microscopy (TEM) experiments will be conducted at 650 °C using three ion beam conditions: Kr ions only, He ions only, and a dual beam of Kr + He ions. Comparative studies between ODS and non-ODS alloys will focus on microstructural evolution, including defect formation, helium bubble distribution, and radiation-induced segregation. Additionally, in-situ irradiation creep experiments will be performed to investigate the role of ODS particles in impeding dislocation motion and delaying crack initiation under stress. This comprehensive study will provide critical insights into the mechanisms by which uniformly distributed ODS particles mitigate helium embrittlement and enhance creep strength. The results will serve as a benchmark for evaluating and optimizing advanced processing routes for next-generation structural materials in nuclear reactor applications.

Additional Info

Field Value
Awarded Institution Helion Energy
DOI 10.46936/NSUF/60015721
Embargo End Date 2028-01-22
Facility Tech Lead Mukesh Bachhav, Wei-Ying Chen
Irradiation Facilities Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility
NSUF Call FY 2025 Super RTE Call
PI Boopathy Kombaiah
PIE Facilities Microscopy and Characterization Suite, Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility
Prep Facilities Intermediate Voltage Electron Microscopy (IVEM)-Tandem Facility
Project Member Dr. Wei-Ying Chen, Material Scientist - Argonne National Laboratory (https://orcid.org/0000-0002-6583-4204)
Project Member Dr. Boopathy Kombaiah - Helion Energy (https://orcid.org/0000-0001-5706-2534)
Project Member Dr. Anshul Kamboj, Distinguished Postdoc - Idaho National Laboratory (https://orcid.org/0009-0001-2576-5478)
Project Type RTE