NSUF 20-2997: Post-irradiation Microstructure Characterization of Radiation-Tolerant Piezoelectric Materials
A major strength of scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (STEM-EELS) approaches is that they provide high-resolution, simultaneous information about local structure, chemistry, and defects. Modern aberration-corrected microscopes, equipped with bright, sub-Angstrom electron probes and high-speed EELS spectrometers, now permit true atomic-scale spectroscopy with exceptional energy resolution. In this study, we propose a combination of STEM, EELS to fingerprint the local chemical environment, and PFM to fingerprint the local piezo response, of the irradiated BiT materials.
추가 정보
| 필드 | 값 |
|---|---|
| Abstract | A major strength of scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (STEM-EELS) approaches is that they provide high-resolution, simultaneous information about local structure, chemistry, and defects. Modern aberration-corrected microscopes, equipped with bright, sub-Angstrom electron probes and high-speed EELS spectrometers, now permit true atomic-scale spectroscopy with exceptional energy resolution. In this study, we propose a combination of STEM, EELS to fingerprint the local chemical environment, and PFM to fingerprint the local piezo response, of the irradiated BiT materials. |
| Award Announced Date | 2020-02-05T14:14:55.753 |
| Awarded Institution | None |
| Facility | None |
| Facility Tech Lead | Stuart Maloy |
| Irradiation Facility | None |
| PI | Eva Zarkadoula |
| PI Email | [email protected] |
| Project Type | RTE |
| RTE Number | 2997 |