NSUF 14-472: Microstructure Evolution in Ion Irradiated UO2.

Understanding irradiation damage evolution in UO2 is crucial to the fleet of current and future nuclear power plants operating globally. Insofar as all of the phenomena caused by radiation damage originate from point defects, the elucidation of radiation effects on the atomic scale is crucial. However, it is difficult because the irradiation defects are aperiodic. This lack of periodicity renders standard approaches, such as TEM and XRD and techniques that are sensitive to short range order are required. X-ray absorption fine structure spectroscopy (XAFS) measures the population-weighted local structure and chemical speciation of the examined elements making it perhaps the most incisive method for determining the local range order in irradiated materials. Transmission Electron Microscopy measurements are crucial to relating the short range changes observed using EXAFS to the long range complicated microstructures created via irradiation. Understanding defects at various length is necessary to predict fuel degradation under reactor conditions.

Tilleggsinformasjon

Felt	Verdi
Awarded Institution	University of Wisconsin
Embargo End Date	2026-02-27
Facility Tech Lead	Mukesh Bachhav
NSUF Call	FY 2014 RTE 1st Call
PI	Mahima Gupta
Project Member	Dr. Jian Gan, Research Scientist - Idaho National Laboratory (https://orcid.org/0000-0002-9121-4164)
Project Member	Mahima Gupta - University of Wisconsin
Project Member	Janne Pakarinen - Consultant
Project Member	Todd Allen, Professor - University of Wisconsin (https://orcid.org/0000-0002-2372-7259)
Project Type	RTE
Publication	In Situ TEM Observation of Dislocation Evolution in Polycrystalline UO2 Todd Allen, Jian Gan, Mahima Gupta, Janne Pakarinen, Lingfeng He JOM 66 2014-12-19 https://link.springer.com/article/10.1007/s11837-014-1186-6#Notes
RTE Number	472